Flat film defect inspection measures
A flat film defect inspection method that can completely detect flaws that are difficult to see with just one wavelength.
We handle the "Flat Film Defect Inspection System" manufactured by Dr. Schenk (Germany). With high-speed switching technology for bright and dark light sources, it can capture images of the same defect from different light sources across up to 5 channels, allowing for the detection of defects that may not be visible with just one wavelength. This enables us to achieve a high defect classification capability, allowing for the differentiation of Critical Defect, Marginal, and Negligible. 【Features】 ■ Manufactured by Dr. Schenk (Germany) ■ Captures images of the same defect from different light sources across up to 5 channels ■ Completely detects defects that may not be visible with just one wavelength ■ High S/N ratio detection for defects due to unique high-brightness LED light sources ■ Capable of observing film quality such as film thickness and haze (software option) *For more details, please refer to the PDF document or feel free to contact us.
- 企業：CBC
- 価格：Other
